Analysis of Ti nanolayers irradiated with Xeq＋ ions using synchrotron radiation based X-ray reflectometry
| Autor: | Stachura, R., Banaś, D., Kubala-Kukuś, A., Stabrawa, I., Jagodziński, P., Szary, K., Foks, A., Braziewicz, J., Semaniak, J., Pajek, M., Aquilanti, G., Božičević Mihalić, I., Teodorczyk, M. |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, B March 2023 536:126-131 |
| Databáze: | ScienceDirect |
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