Impact of TID on latch up induced by pulsed irradiation in CMOS circuits
| Autor: | Li, Ruibin, He, Chaohui, Chen, Wei, Li, Junlin, Wang, Chenhui, Wang, Guizhen, Qi, Chao, Yang, Shanchao, Jin, Xiaoming, Liu, Yan, Bai, Xiaoyan |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, B 1 February 2019 440:95-100 |
| Databáze: | ScienceDirect |
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