Reverse annealing studies of irradiated silicon by use of current–voltage measurements
| Autor: | Moloi, S.J., McPherson, M. |
|---|---|
| Zdroj: | In Nuclear Inst. and Methods in Physics Research, B 1 February 2019 440:64-67 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Moloi, S.J., McPherson, M. |
|---|---|
| Zdroj: | In Nuclear Inst. and Methods in Physics Research, B 1 February 2019 440:64-67 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect