Preliminary single event effect distribution investigation on 28 nm SoC using heavy ion microbeam
| Autor: | Yang, Weitao, Du, Xuecheng, Guo, Jinlong, Wei, Junze, Du, Guanghua, He, Chaohui, Liu, Wenjing, Shen, Shuaishuai, Huang, Chengliang, Li, Yonghong, Fan, Yunyun |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, B 1 July 2019 450:323-326 |
| Databáze: | ScienceDirect |
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