Electrical characterization of electron irradiated and annealed lowly-doped 4H-SiC
| Autor: | Omotoso, E., Paradzah, A.T., Legodi, M.J., Diale, M., Meyer, W.E., Auret, F.D. |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, B 15 October 2017 409:41-45 |
| Databáze: | ScienceDirect |
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