Nuclear microprobe investigation of the effects of ionization and displacement damage in vertical, high voltage GaN diodes

Autor: Vizkelethy, G., King, M.P., Aktas, O., Kizilyalli, I.C., Kaplar, R.J.
Zdroj: In Nuclear Inst. and Methods in Physics Research, B 1 August 2017 404:264-268
Databáze: ScienceDirect