Oxygen depth profiling by resonant backscattering and glow discharge optical emission spectroscopy of Ti-6Al-4V alloy oxidized by ion implantation and plasma based treatment
| Autor: | Nsengiyumva, S., Topic, M., Pichon, L., Comrie, C.M., Mtshali, C. |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, B 1 October 2016 384:50-60 |
| Databáze: | ScienceDirect |
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