A comparison of 4 MeV Proton and Co-60 gamma irradiation induced degradation in the electrical characteristics of N-channel MOSFETs
| Autor: | Anjum, Arshiya, Vinayakprasanna, N.H., Pradeep, T.M., Pushpa, N., Krishna, J.B.M., Gnana Prakash, A.P. |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, B 15 July 2016 379:265-271 |
| Databáze: | ScienceDirect |
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