Medium-energy ion-beam simulation of the effect of ionizing radiation and displacement damage on SiO2-based memristive nanostructures

Autor: Belov, Alexey, Mikhaylov, Alexey, Korolev, Dmitry, Guseinov, Davud, Gryaznov, Eugeny, Okulich, Eugenia, Sergeev, Victor, Antonov, Ivan, Kasatkin, Alexandr, Gorshkov, Oleg, Tetelbaum, David, Kozlovski, Vitali
Zdroj: In Nuclear Inst. and Methods in Physics Research, B 15 July 2016 379:13-17
Databáze: ScienceDirect