Application of stencil masks for ion beam lithographic patterning

Autor: Brun, S., Savu, V., Schintke, S., Guibert, E., Keppner, H., Brugger, J., Whitlow, H.J.
Zdroj: In Nuclear Inst. and Methods in Physics Research, B 1 July 2013 306:292-295
Databáze: ScienceDirect