Characterization of nanostructured HfO 2 films using RBS and PAC
| Autor: | Cavalcante, F.H.M., Gomes, M.R., Carbonari, A.W., Pereira, L.F.D., Rossetto, D.A., Costa, M.S., Alves, E., Barradas, N.P., Franco, N., Redondo, L.M., Lopes, A.M.L., Soares, J.C. |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, B 2012 273:195-198 |
| Databáze: | ScienceDirect |
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