Rutherford backscattering analysis of porous thin TiO 2 films

Autor: Mayer, M., von Toussaint, U., Dewalque, J., Dubreuil, O., Henrist, C., Cloots, R., Mathis, F.
Zdroj: In Nuclear Inst. and Methods in Physics Research, B 2012 273:83-87
Databáze: ScienceDirect