Rutherford backscattering analysis of porous thin TiO 2 films
Autor: | Mayer, M., von Toussaint, U., Dewalque, J., Dubreuil, O., Henrist, C., Cloots, R., Mathis, F. |
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Zdroj: | In Nuclear Inst. and Methods in Physics Research, B 2012 273:83-87 |
Databáze: | ScienceDirect |
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