Holistic RBS–PIXE data reanalysis of SBT thin film samples

Autor: Reis, M.A., Barradas, N.P., Pascual-Izarra, C., Chaves, P.C., Ramos, A.R., Alves, E., González-Aguilar, G., Costa, M.E.V., Miranda Salvado, I.M.
Zdroj: In Nuclear Inst. and Methods in Physics Research, B August 2007 261(1-2):439-442
Databáze: ScienceDirect