Measurement of the transient response of semiconductor devices to ionizing radiation
| Autor: | McMorrow, Dale, Boos, J. Brad, Melinger, Joseph S., Ferlet-Cavrois, Veronique, Paillet, Philippe, Duhamel, Olivier, Baggio, Jacques |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, B August 2007 261(1-2):1137-1141 |
| Databáze: | ScienceDirect |
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