Quantitative determination of depth carrier profiles in ion-implanted Gallium Nitride
Autor: | Iucolano, F., Giannazzo, F., Roccaforte, F., Romano, L., Grimaldi, M.G., Raineri, V. |
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Zdroj: | In Nuclear Inst. and Methods in Physics Research, B April 2007 257(1-2):336-339 |
Databáze: | ScienceDirect |
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