Electrical characterization of defects in heavy-ion implanted n-type Ge
| Autor: | Auret, F.D., van Rensburg, P.J. Janse, Hayes, M., Nel, J.M., Coelho, S., Meyer, W.E., Decoster, S., Matias, V., Vantomme, A., Smeets, D. |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, B April 2007 257(1-2):169-171 |
| Databáze: | ScienceDirect |
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