2-D simulation and analysis of temperature effects on electrical parameters degradation of power RF LDMOS device
| Autor: | Belaïd, M.A., Ketata, K., Gares, M., Marcon, J., Mourgues, K., Masmoudi, M. |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, B December 2006 253(1-2):250-254 |
| Databáze: | ScienceDirect |
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