Characterization of heterogeneous SiO2 materials by scanning electron microscope and micro fluorescence XAS techniques
| Autor: | Khouchaf, L., Boinski, F., Tuilier, M.H., Flank, A.M. |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, B November 2006 252(2):333-338 |
| Databáze: | ScienceDirect |
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