Reliability study of bulk and SOI SRAMs using high energy nuclear probes
| Autor: | Abo, Satoshi, Yamagiwa, Hiroto, Iwamatsu, Toshiaki, Maegawa, Shigeto, Arita, Yutaka, Ipposhi, Takashi, Kinomura, Atsushi, Wakaya, Fujio, Takai, Mikio |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, B April 2005 231(1-4):482-485 |
| Databáze: | ScienceDirect |
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