A small and compact AMS facility for tritium depth profiling
| Autor: | Friedrich, M, Pilz, W, Bekris, N, Glugla, M, Kiisk, M, Liechtenstein, V |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, B August 2004 223-224:21-25 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect