Depth characterization of nm-layers by low energy ion scattering
| Autor: | Draxler, M., Markin, S.N., Beikler, R., Taglauer, E., Kastner, F., Bergsmann, M., Bauer, P. |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, B 2004 219:578-583 |
| Databáze: | ScienceDirect |
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