Relating potato yield to the level of soil degradation using a bulk yield monitor and differential global positioning systems

Autor: DeHaan, K.R *, Vessey, G.T, Holmstrom, D.A, MacLeod, J.A, Sanderson, J.B, Carter, M.R
Zdroj: In Computers and Electronics in Agriculture 1999 23(2):133-143
Databáze: ScienceDirect