Relating potato yield to the level of soil degradation using a bulk yield monitor and differential global positioning systems
Autor: | DeHaan, K.R *, Vessey, G.T, Holmstrom, D.A, MacLeod, J.A, Sanderson, J.B, Carter, M.R |
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Zdroj: | In Computers and Electronics in Agriculture 1999 23(2):133-143 |
Databáze: | ScienceDirect |
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