Low-cost assessment of wheat resistance to yellow rust through conventional RGB images
| Autor: | Zhou, B., Elazab, A., Bort, J., Vergara, O., Serret, M.D., Araus, J.L. |
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| Zdroj: | In Computers and Electronics in Agriculture August 2015 116:20-29 |
| Databáze: | ScienceDirect |
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