Characteristics of tantalum pentoxide dielectric films deposited on silicon by excimer-lamp assisted photo-induced CVD using an injection liquid source

Autor: Mooney, M.B., Hurley, P.K., O'Sullivan, B.J., Beechinor, J.T., Zhang, J.-Y., Boyd, I.W., Kelly, P.V., Sénateur, J.-P., Crean, G.M., Jimenez, C., Paillous, M.
Zdroj: In Microelectronic Engineering 1999 48(1):283-286
Databáze: ScienceDirect