Elastic and inelastic single electron tunneling in coupled two dot system

Autor: Tarucha, Seigo, Fujisawa, T., Ono, K., Austing, D.G., Oosterkamp, T.H., van der Wiel, W.G., Kouwenhoven, L.P.
Zdroj: In Microelectronic Engineering 1999 47(1):101-105
Databáze: ScienceDirect