Scaling of silicon trench etch rates and profiles in plasma etching
Autor: | Lukichev, V.F., Yunkin, V.A. |
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Zdroj: | In Microelectronic Engineering 1999 46(1):315-318 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Lukichev, V.F., Yunkin, V.A. |
---|---|
Zdroj: | In Microelectronic Engineering 1999 46(1):315-318 |
Databáze: | ScienceDirect |
Externí odkaz: |