Feasibility study of fabricating 20 nm resolution dielectric Fresnel zone plates with ultrahigh aspect ratio for EUV optics

Autor: Wu, Qingxin, Chen, Qiucheng, Quan, Hao, Tong, Xujie, Zhao, Jun, Chen, Yifang
Zdroj: In Microelectronic Engineering 15 September 2024 292
Databáze: ScienceDirect