Investigation of trapping/de-trapping dynamics of surface states in AlGaN/GaN high-electron mobility transistors based on dual-gate structures
| Autor: | Luan, Tiantian, Jiang, Qimeng, Huang, Sen, Wang, Xinhua, Jin, Hao, Guo, Fuqiang, Yao, Yixu, Fan, Jie, Yin, Haibo, Wei, Ke, Li, Yankui, Jiang, Haojie, Li, Junfeng, Liu, Xinyu |
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| Zdroj: | In Microelectronic Engineering 25 January 2023 269 |
| Databáze: | ScienceDirect |
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