Effects of heavy ion irradiation on Cu/Al2O3/Pt CBRAM devices
| Autor: | Su, Chaohui, Shan, Linbo, Yang, Dongliang, Zhao, Yanfei, Fu, Yujun, Liu, Jiande, Zhang, Guangan, Wang, Qi, He, Deyan |
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| Zdroj: | In Microelectronic Engineering 15 July 2021 247 |
| Databáze: | ScienceDirect |
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