Simple method for determining Si p-n junction depth using anodization
Autor: | Hourdakis, E., Pepponi, G., Barozzi, M., Nassiopoulou, A.G. |
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Zdroj: | In Microelectronic Engineering 1 May 2021 244-246 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Hourdakis, E., Pepponi, G., Barozzi, M., Nassiopoulou, A.G. |
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Zdroj: | In Microelectronic Engineering 1 May 2021 244-246 |
Databáze: | ScienceDirect |
Externí odkaz: |