Effect of interfacial InZnO conducting layer on electrical performance and bias stress stability of InAlZnO thin-film transistors
| Autor: | Woo, Kyoungwan, Lee, Se Hyeong, Lee, Sanghyun, Bak, So-Young, Kim, Yoo-Jong, Yi, Moonsuk |
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| Zdroj: | In Microelectronic Engineering 15 July 2019 215 |
| Databáze: | ScienceDirect |
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