Processing and integration of graphene in a 200 mm wafer Si technology environment

Autor: Lisker, M., Lukosius, M., Fraschke, M., Kitzmann, J., Dabrowski, J., Fursenko, O., Kulse, P., Schulz, K., Krüger, A., Drews, J., Schulze, S., Wolansky, D., Schubert, A.M., Katzer, J., Stolarek, D., Costina, I., Wolff, A., Dziallas, G., Coccetti, F., Mai, A.
Zdroj: In Microelectronic Engineering 15 January 2019 205:44-52
Databáze: ScienceDirect