Photoetching method that provides improved silicon-on-insulator layer thickness uniformity in a defined area

Autor: Miyata, Yuki, Nakamukai, Yasunori, Azevedo, Cassia Tiemi, Morita, Miho, Uchikoshi, Junichi, Kawai, Kentaro, Arima, Kenta, Morita, Mizuho
Zdroj: In Microelectronic Engineering 5 August 2017 180:93-95
Databáze: ScienceDirect