Defect creation in amorphous HfO2 facilitated by hole and electron injection
Autor: | Strand, Jack, Kaviani, Moloud, Shluger, Alexander L. |
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Zdroj: | In Microelectronic Engineering 25 June 2017 178:279-283 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Strand, Jack, Kaviani, Moloud, Shluger, Alexander L. |
---|---|
Zdroj: | In Microelectronic Engineering 25 June 2017 178:279-283 |
Databáze: | ScienceDirect |
Externí odkaz: |