Optimizing process conditions for improved Hf1 − xZrxO2 ferroelectric capacitor performance

Autor: Mittmann, Terence, Fengler, Franz P.G., Richter, Claudia, Park, Min Hyuk, Mikolajick, Thomas, Schroeder, Uwe
Zdroj: In Microelectronic Engineering 25 June 2017 178:48-51
Databáze: ScienceDirect