Phase analysis and thermal stability of thin films synthesized via solid state reaction of Ni with Si1 − xGex substrate
Autor: | Peter, Antony Premkumar, Witters, Thomas, Dutta, Shibesh, Hikavvy, Andriy, Vaesen, Inge, Van Elshocht, Sven, Schaekers, Marc |
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Zdroj: | In Microelectronic Engineering 5 January 2016 149:46-51 |
Databáze: | ScienceDirect |
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