28 nm pitch of line/space pattern transfer into silicon substrates with chemo-epitaxy Directed Self-Assembly (DSA) process flow

Autor: Chan, Boon Teik, Tahara, Shigeru, Parnell, Doni, Rincon Delgadillo, Paulina A., Gronheid, Roel, de Marneffe, Jean-François, Xu, Kaidong, Nishimura, Eiichi, Boullart, Werner
Zdroj: In Microelectronic Engineering 1 July 2014 123:180-186
Databáze: ScienceDirect