Photolithographic properties of tin-oxo clusters using extreme ultraviolet light (13.5 nm)

Autor: Cardineau, Brian, Del Re, Ryan, Marnell, Miles, Al-Mashat, Hashim, Vockenhuber, Michaela, Ekinci, Yasin, Sarma, Chandra, Freedman, Daniel A., Brainard, Robert L.
Zdroj: In Microelectronic Engineering 5 September 2014 127:44-50
Databáze: ScienceDirect