Analysis of thin-film PZT/LNO stacks on an encapsulated TiN electrode

Autor: Kaleli, B., Nguyen, M.D., Schmitz, J., Wolters, R.A.M., Hueting, R.J.E.
Zdroj: In Microelectronic Engineering 1 May 2014 119:16-19
Databáze: ScienceDirect