Analysis of thin-film PZT/LNO stacks on an encapsulated TiN electrode
Autor: | Kaleli, B., Nguyen, M.D., Schmitz, J., Wolters, R.A.M., Hueting, R.J.E. |
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Zdroj: | In Microelectronic Engineering 1 May 2014 119:16-19 |
Databáze: | ScienceDirect |
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