Recycling a slurry for reuse in chemical mechanical planarization of tungsten wafer: Effect of chemical adjustments and comparison between static and dynamic experiments

Autor: Testa, F., Coetsier, C., Carretier, E., Ennahali, M., Laborie, B., Moulin, P.
Zdroj: In Microelectronic Engineering January 2014 113:114-122
Databáze: ScienceDirect