MOSFET layout modifications for hump effect removal
Autor: | Carmona, M., Rebuffat, B., Delalleau, J., Gagliano, O., Lopez, L., Ogier, J.-L., Goguenheim, D. |
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Zdroj: | In Microelectronic Engineering September 2013 109:168-171 |
Databáze: | ScienceDirect |
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