Vertically-stacked gate-all-around polysilicon nanowire FETs with sub-[formula omitted]m gates patterned by nanostencil lithography

Autor: Sacchetto, Davide, Xie, Shenqi, Savu, Veronica, Zervas, Michael, De Micheli, Giovanni, Brugger, Jürgen, Leblebici, Yusuf
Zdroj: In Microelectronic Engineering October 2012 98:355-358
Databáze: ScienceDirect