High volume nanoimprint lithography on III/V substrates: Imprint fidelity and stamp lifetime

Autor: Eriksson, Torbjörn, Yamada, Shoko, Venkatesh Krishnan, Prasanna, Ramasamy, Sankar, Heidari, Babak
Zdroj: In Microelectronic Engineering March 2011 88(3):293-299
Databáze: ScienceDirect