Full wafer microlens replication by UV imprint lithography
Autor: | Schmitt, H., Rommel, M., Bauer, A.J., Frey, L., Bich, A., Eisner, M., Voelkel, R., Hornung, M. |
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Zdroj: | In Microelectronic Engineering 2010 87(5):1074-1076 |
Databáze: | ScienceDirect |
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