Fabrication and characterization of coaxial scanning near-field optical microscopy cantilever sensors

Autor: Salomo, M., Bayer, D., Schaaf, B.R., Aeschlimann, M., Oesterschulze, E.
Zdroj: In Microelectronic Engineering 2010 87(5):1540-1542
Databáze: ScienceDirect