Characterization of device performance and reliability of high performance Ge-on-Si field-effect transistor
| Autor: | Choi, Won-Ho, Oh, Jungwoo, Yoo, Ook-Sang, Han, In-Shik, Na, Min-Ki, Kwon, Hyuk-Min, Park, Byung-Suk, Majhi, P., Tseng, H.-H., Jammy, R., Lee, Hi-Deok |
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| Zdroj: | In Microelectronic Engineering 2011 88(12):3424-3427 |
| Databáze: | ScienceDirect |
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