Study of polycrystalline-Si thin-film transistors with different channel layer thickness at low bias voltage
Autor: | Juang, Miin-Horng, Chang, C.W., Wang, J.L., Shye, D.C., Hwang, C.C., Jang, S.L. |
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Zdroj: | In Microelectronic Engineering 2010 87(10):1896-1900 |
Databáze: | ScienceDirect |
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