Determination of local electrostatic forces for EUVL mask chucks

Autor: Kalkowski, Gerhard, Peschel, Thomas, Risse, Stefan, Müller, Sandra, Engelstad, Roxann L., Zeuske, Jacob R., Vukkadala, Pradeep
Zdroj: In Microelectronic Engineering 2010 87(5):1287-1289
Databáze: ScienceDirect