Thinned wafer multi-stack 3DI technology

Autor: Ohba, Takayuki, Maeda, Nobuhide, Kitada, Hideki, Fujimoto, Koji, Suzuki, Kousuke, Nakamura, Tomoji, Kawai, Akihito, Arai, Kazuhisa
Zdroj: In Microelectronic Engineering 2010 87(3):485-490
Databáze: ScienceDirect