Effect of heat treatments on electric dipole at metal/high- k dielectric interfaces measured by in situ XPS

Autor: Zenkevich, Andrei, Lebedinskii, Yuri, Matveyev, Yuri, Spiga, Sabina, Lamagna, Luca, Fanciulli, Marco
Zdroj: In Microelectronic Engineering 2009 86(7):1777-1779
Databáze: ScienceDirect